Use Statistical Circuit Analysis with Excel for Yield Analysis

Abstract: This article describes a simple technique for circuit designers to perform a comprehensive statistical analysis on virtually any circuit using just an Excel® spreadsheet. The article shows how to generate random component values to be used in yield analyses. A probability distribution function (pdf) and cumulative distribution function (cdf) are described. For special cases, a simple technique uses a uniformly distributed random number together with the measured cdf to generate arbitrarily distributed random numbers. These techniques are valuable to gain an insight into the operation of any circuit under real-world conditions and to ensure that it will have high manufacturing yields.