Defining and Testing Dynamic Parameters in High-Speed ADCs, Part 1

Abstract: The first part of this article series discusses commonly known definitions most crucial for high-speed data converters (in this case analog-to-digital converter or short ADCs) used in communications, instrumentation and data acquisition applications. The purpose of this article is to help the reader gain a better understanding of common parameters such as signal-to-noise ratio (SNR), signal-to-noise-and-distortion (SINAD), total harmonic distortion (THD) and spurious-free dynamic range (SFDR). In the second part of this article series (see \"Dynamic Testing of High-Speed ADCs\" for further reading), these parameter definitions are put to the test by measuring them in real-world test scenarios.